Advances in Imaging and Electron Physics —— Theory of Intense Beams of Charged Particles

----- 成像和电子物理学进展

ISBN: 9780123813107 出版年：2011 页码：753 Academic Press_Series

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.Contributions from leading international scholars and industry expertsDiscusses hot topic areas and presents current and future research trendsInvaluable reference and guide for physicists, engineers and mathematicians