Advances in Imaging and Electron Physics —— Optics of Charged Particle Analyzers

----- 成像与电子物理学进展 第157卷: 带电粒子分析器的光学

ISBN: 9780123747686 出版年：2009 页码：406 Academic Press_Series

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.* Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians