Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

ISBN: 9789812389404 出版年：2004 页码：349 Ronald D Schrimpf Daniel M Fleetwood World Scientific Publishing Company

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide- semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.