Terrestrial Neutron-induced Soft Error In Advanced Memory Devices

ISBN: 9789812778819 出版年：2008 页码：364 Takashi Nakamura Eishi Ibe World Scientific Publishing Company

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.