Atomic Force Microscopy in Adhesion Studies

ISBN: 9789067644341 出版年：2005 页码：823 CRC Press

Since its discovery, Atomic Force Microscopy (AFM) has become a technique of choice for non-destructive surface characterization with sub-molecular resolution. The AFM has also emerged as a problem-solving tool in applications relevant to particle-solid and particle-liquid interactions, design, fabrication, and characterization of new materials, an