Conductive Atomic Force Microscopy —— Applications in Nanomaterials

----- 导电原子力显微镜

ISBN: 9783527340910 出版年：2017 页码：384 Mario Lanza Wiley

The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.