Nanoscale Characterization of Surfaces and Interfaces

Name: Nanoscale Characterization of Surfaces and Interfaces
Rating: 4.38
ISBN: 9783527292479

ISBN: 9783527292479 出版年：2008 页码：176 N John DiNardo Wiley

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Scanning Tunneling Microscopy (STM) Atomic Force Microscopy Manipulation of Atoms and Atom Clusters on the Nanoscale Spin-offs of STM: Non-Contact Nanoscale Probes.

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