Advanced Techniques for Materials Characterization

ISBN: 9780878493791 出版年：2009 页码：528 Trans Tech Publications Ltd

Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chemists, biologists and engineers in order to solve analytical research problems; especially those related to the investigation of the properties of new materials for advanced applications. Although there are a few available books which deal with such experimental techniques, they are either too exhaustive and cover very few techniques or are too elementary to provide a solid basis for learning to use the characterization technique. Moreover, such books usually over-emphasize the textbook approach: being full of theoretical concepts and mathematical derivations, and omitting the practical instruction required in order to permit newcomers to use the techniques.A major objective of the present work is therefore to provide key information that is sufficient to permit the reader to carry out independent research using these characterization techniques. The concise text not only includes classical Diffraction, Spectroscopic and Microscopical techniques but also advanced state-of-the-art techniques such as positron annihilation spectroscopy (PAS), small-angle neutron scattering (SANS), small-angle X-ray scattering (SAXS) and others. The work consists of some 20 chapters; each dedicated to a particular technique, and in the form of a compilation of lectures delivered by dedicated researchers having extensive experience in using the particular technique.