Size Effects in Thin Films

ISBN: 9780444421067 出版年：2016 页码：321 Tellier, C R Tosser, A J North Holland_RM

A complete and comprehensive study of transport phenomena in thin continuous metal films, this book reviews work carried out on external-surface and grain-boundary electron scattering and proposes new theoretical equations for transport properties of these films. It presents a complete theoretical view of the field, and considers imperfection and impurity effects.