Microscopy of Semiconducting Materials 2001

ISBN: 9781315895529 出版年：2018 页码：627 Cullis, A G CRC Press

High resolution microscopy and microanalysis self-organized and quantum domain structures epitaxy - growth phenomena epitaxy - wind band-gap nitrides processed silicon, substrates and dielectrics metalization silicides amd contacts device studies and specimen preparation scanning probe microscopy advanced scanning electron and optical microscopy.