Trap Level Spectroscopy in Amorphous Semiconductors

ISBN: 9780123847157 出版年：2010 页码：129 Mikla, Victor V Mikla, Victor I Elsevier Science_RM

Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages. * Provides information on the most used spectroscopic techniques* Discusses the advantages and disadvantages of each technique