VLSI Test Principles and Architectures —— Design for Testability

----- VLSI测试原理与体系结构：可测试性设计

ISBN: 9780123705976 出版年：2006 页码：809 Wang, Laung-Terng Wu, Cheng-Wen Wen, Xiaoqing Morgan Kaufmann_RM

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.